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revision 1.4, Fri Apr 4 15:01:08 2008 UTC revision 1.5, Mon Apr 7 15:06:17 2008 UTC
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2  and silicon strips of the inner detector system. In addition, the information from the  and silicon strips of the inner detector system. In addition, the information from the
3  transition radiation tracker can be used for particle identification or charged  transition radiation tracker can be used for particle identification or charged
4  particle measurements.  particle measurements.
5  The inside-out track finnding starts from the Pixel and SCT tfind fintrack seeds and further, to create  The inside-out track finnding starts from the Pixel and SCT to find ntrack seeds and further, to create
6  track candidates based on the seeds primarily found. The seeded track  track candidates based on the seeds primarily found. The seeded track
7  finding inresults in a very high number of track candidates, that have to be resolved before an extension  finding results in a very high number of track candidates, that have to be resolved before an extension
8  into the TRT detector can be done. Many of these tracks share hits, are incomplete or describe fake  into the TRT detector can be done. Many of these tracks share hits, are incomplete or describe fake
9  tracks, hence ambiguity solving has to be done. The track extension  tracks, hence ambiguity solving has to be done. The track extension
10  from the Silicon to the TRT is performed in two steps. First tracks found in the Silicon are used as  from the Silicon to the TRT is performed in two steps. First tracks found in the Silicon are used as
11  an input to find a a compatible set of TRT measurements. This is done on a single track by track basis.  an input to find a a compatible set of TRT measurements. This is done on a single track by track basis.
12  Then, the extended track is evaluated with respect to the original pure  Then, the extended track is evaluated with respect to the original pure
13  Silicon track. The comparisons of the two tracks is based on a combined track refitt and then done using  Silicon track. The comparisons of the two tracks is based on a combined track reffit and then done using
14  the track scoring mechanism, comparing the track score of the original track with the one after refiting.  the track scoring mechanism, comparing the track score of the original track with the one after refiting.
15  Currently several different fitting tntechniques exist and are described elsewhere.  Currently several different fitting techniques exist and are described elsewhere.
16    

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